BS EN 933-1-2012 集料的几何特性试验.粒度分布测定.筛法

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【英文标准名称】:Testsforgeometricalpropertiesofaggregates.Determinationofparticlesizedistribution.Sievingmethod
【原文标准名称】:集料的几何特性试验.粒度分布测定.筛法
【标准号】:BSEN933-1-2012
【标准状态】:现行
【国别】:英国
【发布日期】:2012-02-29
【实施或试行日期】:2012-02-29
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:IEC/TC55
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Aggregates;Construction;Constructionmaterials;Definitions;Determination;Dimensions;Geometricalproperties;Grainsize;Grainsizing;Materialstesting;Mineralaggregates;Particlesizedistribution;Particlesizemeasurement;Particulatematerials;Properties;Rocks;Screening(sizing);Testing
【摘要】:
【中国标准分类号】:Q13
【国际标准分类号】:91_100_15
【页数】:22P;A4
【正文语种】:英语


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Product Code:SAE AMS3307
Title:Rubber, Silicone (VMQ), Low Compression Set, Non-Oil-Resistant, 65 - 75
Issuing Committee:Ams Ce Elastomers Committee
Scope:This specification covers a silicone (VMQ) rubber in the form of sheet, strip, and molded shapes.Primarily for parts required to operate or seal from 55掳 to +200掳C ( 67掳 to +392掳F), compounded especially for low compression set. Silicone rubber is resistant to deterioration by ozone, smog, and weathering and remains flexible over the temperature range noted. These products are not intended for use with petroleum base fluids or lubricants. Certain design applications may cause these products to be susceptible to cutting, tearing, and abrasion.While the materials, methods, applications, and processes described or referenced in this specification may involve the use of hazardous materials, this specification does not address the hazards which may be involved in such use. It is the sole responsibility of the user to ensure familiarity with the safe and proper use of any hazardous materials and to take necessary precautionary measures to ensure the health and safety of all personnel involved.【英文标准名称】:Semiconductordevices-Part16-4:microwaveintegratedcircuits-Switches.
【原文标准名称】:半导体器件.第16-4部分:微波集成电路.开关
【标准号】:NFC96-016-4-2004
【标准状态】:现行
【国别】:法国
【发布日期】:2004-12-01
【实施或试行日期】:2004-12-20
【发布单位】:法国标准化协会(AFNOR)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:极限(数学);测量技术;半导体器件;参数;电气工程;术语;基本术语;微波电路;开关电路;功能;集成电路工艺;尺寸选定;微电子学;测量;半导体;词汇;定义;半导体存储;电子设备及元件;电子工程;额定值;集成电路
【英文主题词】:
【摘要】:
【中国标准分类号】:L56
【国际标准分类号】:31_080_99
【页数】:30P;A4
【正文语种】:其他